Research Article Open Access

A COMPARATIVE ANALYSIS OF FIELD PORTABLE X-RAY FLUORESCENCE (FP XRF) AND INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROSCOPY (ICP-AES) METHODS FOR SURFACE DUST

Abstract

Surface dust metal analysis is crucial for environmental monitoring, health risk assessment, and industrial hygiene. Two prominent analytical techniques for this purpose are Field Portable X-ray Fluorescence (FP XRF) and Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES). This research compares the performance of these two methods concerning accuracy, precision, sensitivity, and ease of use for the analysis of metals in surface dust samples. The study evaluates their suitability for various applications and provides insights into their respective strengths and limitations.

CARA O’DONNELL1 , DANIEL AUTENRIETH1* , RAJA NAGISETTY 2

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